X-RAY-DIFFRACTION STUDY OF EPITAXIAL NB-TA OVERLAYERS ON SAPPHIRE

被引：13

作者：

LAMELAS, FJ

HE, H

CLARKE, R

机构：

来源：

PHYSICAL REVIEW B | 1988年 / 38卷 / 09期

关键词：

D O I：

10.1103/PhysRevB.38.6334

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：6334 / 6337

页数：4

共 15 条

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[7]

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