PROFILE INVERSION USING THE RENORMALIZED SOURCE-TYPE INTEGRAL-EQUATION APPROACH

被引:55
作者
HABASHY, TM
CHOW, EY
DUDLEY, DG
机构
[1] HUGHES AIRCRAFT CO,LOS ANGELES,CA 90009
[2] UNIV ARIZONA,DEPT ELECT & COMP ENGN,TUCSON,AZ 85721
关键词
D O I
10.1109/8.53495
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A new and exact inversion equation is presented. If approximations are to be made they will occur in the numerical methods employed in the solution of this inversion equation. This is to be distinguished from other methods, e.g., Born inversion, ray tracing, etc., which are inherently approximate and are hard to improve when they give inaccurate results. This inversion approach is applicable to transverse electric (TE) and extendible to transverse magnetic (TM) polarization with no explicit frequency limitation. By prestoring the elements of the inversion operator, the method does not require the solution to the full forward problem repeatedly. It also allows, in some cases, the rigorous study of the degree of nonuniqueness involved in the inversion, a point of great importance in the design problem. © 1990 IEEE
引用
收藏
页码:668 / 682
页数:15
相关论文
共 15 条
[1]  
Baker C.T.H., 1977, NUMERICAL TREATMENT
[2]  
CHEW WC, 1984, AUG P IGARSS84 STRAS
[3]   INVERSE SCATTERING TECHNIQUE APPLIED TO REMOTE-SENSING OF LAYERED MEDIA [J].
COEN, S ;
MEI, KK ;
ANGELAKOS, DJ .
IEEE TRANSACTIONS ON ANTENNAS AND PROPAGATION, 1981, 29 (02) :298-306
[4]  
FRIEDMAN B, 1960, PRINCIPLES TECHNIQUE
[5]  
Gill P. E., 1981, PRACTICAL OPTIMIZATI
[6]   SIMULTANEOUS RECONSTRUCTION OF PERMITTIVITY AND CONDUCTIVITY PROFILES IN A RADIALLY INHOMOGENEOUS SLAB [J].
HABASHY, TM ;
CHEW, WC ;
CHOW, EY .
RADIO SCIENCE, 1986, 21 (04) :635-645
[7]   ON SOME INVERSE METHODS IN ELECTROMAGNETICS [J].
HABASHY, TM ;
MITTRA, R .
JOURNAL OF ELECTROMAGNETIC WAVES AND APPLICATIONS, 1987, 1 (01) :25-58
[8]  
Kong J. A., 1975, THEORY ELECTROMAGNET
[10]   GENERALIZED HOLOGRAPHY AND COMPUTATIONAL SOLUTIONS TO INVERSE SOURCE PROBLEMS [J].
PORTER, RP ;
DEVANEY, AJ .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1982, 72 (12) :1707-1713