EXTENDED PHOTOEMISSION FINE-STRUCTURE ANALYSIS OF THE SI(111)-(7X7) SURFACE CORE LEVELS - REPLY

被引:3
作者
CARLISLE, JA
MILLER, T
CHIANG, TC
机构
[1] UNIV ILLINOIS, DEPT PHYS, URBANA, IL 61801 USA
[2] UNIV ILLINOIS, MAT RES LAB, URBANA, IL 61801 USA
关键词
D O I
10.1103/PhysRevLett.72.3741
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
引用
收藏
页码:3741 / 3741
页数:1
相关论文
共 3 条
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[2]   EXTENDED PHOTOEMISSION FINE-STRUCTURE ANALYSIS OF THE SI(111)-(7X7) SURFACE CORE LEVELS - COMMENT [J].
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FONTAINE, M .
PHYSICAL REVIEW LETTERS, 1994, 72 (23) :3740-3740
[3]   STRUCTURE-ANALYSIS OF SI(111)-7X7 RECONSTRUCTED SURFACE BY TRANSMISSION ELECTRON-DIFFRACTION [J].
TAKAYANAGI, K ;
TANISHIRO, Y ;
TAKAHASHI, S ;
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SURFACE SCIENCE, 1985, 164 (2-3) :367-392