INSITU SURFACE PROBE ANALYSIS FOR IMPURITY FLUX IN THE HELIOTRON-E DEVICE

被引：6

作者：

MIZUUCHI, T

MOTOJIMA, O

IIYOSHI, A

UO, K

MACHIDA, O

NAKAYAMA, K

HASHIBA, M

SATAKE, T

MOHRI, M

YAMASHINA, T

AMEMIYA, S

机构：

[1] HOKKAIDO UNIV, DEPT NUCL ENGN, SAPPORO, HOKKAIDO 060, JAPAN

[2] NAGOYA UNIV, DEPT NUCL ENGN, NAGOYA, AICHI 464, JAPAN

来源：

JOURNAL OF NUCLEAR MATERIALS | 1987年 / 145卷

关键词：

D O I：

10.1016/0022-3115(87)90390-4

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：508 / 512

页数：5

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