A REFLEXION ELECTRON MICROSCOPE

被引：8

作者：

COSSLETT, VE

JONES, D

机构：

来源：

JOURNAL OF SCIENTIFIC INSTRUMENTS | 1955年 / 32卷 / 03期

关键词：

D O I：

10.1088/0950-7671/32/3/302

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：86 / 91

页数：6

共 14 条

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[2]

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[3]

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[4]

FERT C, 1952, CR HEBD ACAD SCI, V235, P1490

[5] THE ADAPTATION OF AN ELECTRON MICROSCOPE FOR REFLEXION AND SOME OBSERVATIONS ON IMAGE FORMATION [J].

HAINE, ME ;

HIRST, W .

BRITISH JOURNAL OF APPLIED PHYSICS, 1953, 4 (AUG) :239-244

[6]

JONES D, 1954, UNPUB P INT C ELECT

[7]

JONES D, 1953, THESIS U CAMBRIDGE

[8]

KUSHNIR UM, 1951, IZVEST AKAD NAUK SSS, V15, P306

[9] AN IMPROVED SCANNING ELECTRON MICROSCOPE FOR OPAQUE SPECIMENS [J].

MCMULLAN, D ;

THEWLIS, J ;

AGAR, AW ;

GABOR, D ;

HAINE, ME ;

LUBSZYNSKI, HG ;

FEINBERG, R ;

MCMULLAN, D .

PROCEEDINGS OF THE INSTITUTION OF ELECTRICAL ENGINEERS-LONDON, 1953, 100 (75) :245-259

[10]

MENTER JW, 1952, J I MET, V81, P163

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