METHOD FOR IMPROVING THE DETERMINATION OF SILICON BY ATOMIC-ABSORPTION SPECTROMETRY USING A TANTALUM-COATED CARBON FURNACE

被引：18

作者：

LYTHGOE, DJ

机构：

来源：

ANALYST | 1981年 / 106卷 / 1264期

关键词：

D O I：

10.1039/an9810600743

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

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页码：743 / 750

页数：8

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