APPLICATION OF SECONDARY-ELECTRON CHANNEL MULTIPLIERS TO SCANNING ELECTRON MICROSCOPY

被引：10

作者：

HUGHES, KA

SULWAY, DV

WAYTE, RC

THORNTON, PR

机构：

来源：

关键词：

D O I：

10.1063/1.1709247

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：4922 / &

共 6 条

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EVERHART, TE
THORNLEY, RFM
[J]. JOURNAL OF SCIENTIFIC INSTRUMENTS, 1960, 37 (07): : 246 - 248
[3] KIMOTO S, 1966, ELECTRON MICROPROBE, P480
[4] MCKINLEY T, 1966, ELECTRON MICROPRO ED, P480
[5] AN IMPROVED SCANNING ELECTRON MICROSCOPE FOR OPAQUE SPECIMENS
MCMULLAN, D
THEWLIS, J
AGAR, AW
GABOR, D
HAINE, ME
LUBSZYNSKI, HG
FEINBERG, R
MCMULLAN, D
[J]. PROCEEDINGS OF THE INSTITUTION OF ELECTRICAL ENGINEERS-LONDON, 1953, 100 (75): : 245 - 259
[6] Oatley C.W., 1957, J ELECTRON CONTR, V2, P568