CONTACTLESS MEASUREMENT OF ELECTRICAL-RESISTIVITY BY EDDY-CURRENT METHODS - DISCUSSION AND A NEW TECHNIQUE

被引：15

作者：

WEJGAARD, W ^{[1
]}

TOMAR, VS ^{[1
]}

机构：

[1] ETH,LAB FESTKORPERPHYS,ZURICH,SWITZERLAND

来源：

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1974年 / 7卷 / 05期

关键词：

D O I：

10.1088/0022-3735/7/5/027

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：395 / 399

页数：5

共 14 条

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[6]

Chambers R. G., 1961, BRIT J APPL PHYS, V12, P507

[7] CHARACTERIZATION OF HIGH-PURITY METALS BY EDDY-CURRENT DECAY METHOD [J].

CLARK, AF ;

POWELL, RL ;

DEASON, VA .

CRYOGENICS, 1972, 12 (01) :35-&

[8] A NEW SIZE EFFECT [J].

COTTI, P .

PHYSICS LETTERS, 1963, 4 (02) :114-116

[9] EDDY CURRENT METHOD FOR LOW TEMPERATURE RESISTIVITY MEASUREMENTS [J].

DAYBELL, MD .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1967, 38 (10) :1412-&

[10] ELECTRODELESS METHODS FOR CONDUCTIVITY MEASUREMENT IN METALS [J].

DELANEY, JA ;

PIPPARD, AB .

REPORTS ON PROGRESS IN PHYSICS, 1972, 35 (07) :677-+

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