EVIDENCE FOR HOLE TRAPS IN CDS CRYSTALS

被引：5

作者：

IM, HB

MATTHEWS, HE

BUBE, RH

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1970年 / 41卷 / 06期

关键词：

D O I：

10.1063/1.1659306

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：2751 / &

共 10 条

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[3]

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[4]

GRIGAS BP, 1966, SOV PHYS SOLID STATE, V7, P2942

[5] EVIDENCE FOR PHOTOCHEMICAL CHANGES IN TRAPS IN CDS CRYSTALS [J].

IM, HB ;

MATTHEWS, HE ;

BUBE, RH .

JOURNAL OF APPLIED PHYSICS, 1970, 41 (06) :2581-&

[6] PHOTOELECTRONIC EVALUATION OF ELECTRON RADIATION DAMAGE IN CDS CRYSTALS [J].

IM, HB ;

BUBE, RH .

JOURNAL OF APPLIED PHYSICS, 1968, 39 (06) :2908-&

[7] PHOTOTHERMOELECTRIC AND THERMALLY STIMULATED THERMOELECTRIC EFFECTS - TECHNIQUES IN PHOTOELECTRONIC ANALYSIS [J].

LAWRANCE, R ;

BUBE, RH .

JOURNAL OF APPLIED PHYSICS, 1968, 39 (03) :1807-&

[8] NATURE OF EDGE EMISSION IN CADMIUM SULFIDE [J].

MAEDA, K .

JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1965, 26 (09) :1419-&

[9] SEEBECK EFFECT IN CADMIUM SULFIDE [J].

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[10]

PIPER WW, 1960, P INT C SEMICONDUCTO, P1046

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