CHARGED-PARTICLE RADIATION DAMAGE OBSERVED AS DIMPLING OF THIN SILICON TARGETS

被引：9

作者：

MEEK, RL

GIBSON, WM

SELLSCHOP, JP

机构：

来源：

APPLIED PHYSICS LETTERS | 1971年 / 18卷 / 12期

关键词：

D O I：

10.1063/1.1653528

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：535 / +

页数：1

共 25 条

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