THERMOREFLECTANCE AS A PRACTICAL TOOL FOR THE EXTENSION OF THE OPTICAL-CONSTANT DATA IN A WIDE DOMAIN OF TEMPERATURE - APPLICATION TO LEAD BETWEEN 298-K AND 538-K

被引：7

作者：

KOFMAN, R

CHEYSSAC, P

GARRIGOS, R

机构：

[1] CNRS, Nice, Fr, CNRS, Nice, Fr

来源：

OPTICS COMMUNICATIONS | 1987年 / 61卷 / 04期

关键词：

LEAD AND ALLOYS - Optical Properties - OPTICAL PROPERTIES - Measurements;

D O I：

10.1016/0030-4018(87)90103-9

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Thermoreflectance measurements allow the extension of the optical constant data of a material, known for one or a few temperatures, in a wider domain of temperature. This extrapolation method is easier to use than the conventional produres on both the experimental and theoretical grounds.

引用

页码：261 / 265

页数：5

共 7 条

[1] OPTICAL-PROPERTIES OF VERY THIN-FILMS
ABELES, F
[J]. THIN SOLID FILMS, 1976, 34 (02) : 291 - 302
[2] Cardona M., 1969, MODULATION SPECTROSC, V11
[3] GARRIGOS R, 1986, EUROPHYSICS LETT, V7, P355
[4] OPTICAL-PROPERTIES OF GA MONO-CRYSTAL IN 0.3-5-EV RANGE
KOFMAN, R
CHEYSSAC, P
RICHARD, J
[J]. PHYSICAL REVIEW B, 1977, 16 (12): : 5216 - 5224
[5] KOFMAN R, 1980, THESIS NICE
[6] MALITSON IH, 1962, J OPT SOC AM, V52, P377
[7] ABSOLUTE VALUES OF OPTICAL-CONSTANTS OF SOME PURE METALS
MATHEWSON, AG
MYERS, HP
[J]. PHYSICA SCRIPTA, 1971, 4 (06) : 291 - +

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