EVOLUTION OF A SURFACE-STATE INTO AN INTERFACE STATE - A PROBE OF THE BURIED EPITAXIAL CR/AU(100) INTERFACE

被引：5

作者：

ONEILL, DG ^{[1
]}

WEAVER, JH ^{[1
]}

机构：

[1] UNIV MINNESOTA,DEPT CHEM ENGN & MAT SCI,MINNEAPOLIS,MN 55455

来源：

PHYSICAL REVIEW B | 1987年 / 35卷 / 11期

关键词：

D O I：

10.1103/PhysRevB.35.5892

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：5892 / 5895

页数：4

共 27 条

[1] OBSERVATION OF A CHANGE IN SURFACE ELECTRONIC-STRUCTURE OF PT(100) INDUCED BY RECONSTRUCTION [J].

BONZEL, HP ;

HELMS, CR ;

KELEMEN, S .

PHYSICAL REVIEW LETTERS, 1975, 35 (18) :1237-1240

[2] SUPERCONDUCTIVITY IN AU/CR/AU EPITAXIAL METAL-FILM SANDWICHES (EMFS) [J].

BRODSKY, MB ;

MARIKAR, P ;

FRIDDLE, RJ ;

SINGER, L ;

SOWERS, CH .

SOLID STATE COMMUNICATIONS, 1982, 42 (09) :675-678

[3] OBSERVATION OF A STRONGLY ENHANCED MAGNETIC-SUSCEPTIBILITY OF PD IN AU-PD-AU SANDWICHES [J].

BRODSKY, MB ;

FREEMAN, AJ .

PHYSICAL REVIEW LETTERS, 1980, 45 (02) :133-137

[4] MOMENTUM-DEPENDENT LINE-SHAPES IN PHOTOEMISSION [J].

DIDIO, RA ;

PLUMMER, EW ;

GRAHAM, WR .

PHYSICAL REVIEW LETTERS, 1984, 52 (08) :683-686

[5] AU (100) SURFACE RECONSTRUCTION [J].

ERCOLESSI, F ;

TOSATTI, E ;

PARRINELLO, M .

PHYSICAL REVIEW LETTERS, 1986, 57 (06) :719-722

[6] SURFACE-STATES OF CLEAN AND METAL-OVERLAYER-COVERED CR(001) FILMS [J].

FEIBELMAN, PJ ;

HAMANN, DR .

PHYSICAL REVIEW B, 1985, 31 (02) :1154-1156

[7] PREDICTION OF STRONGLY ENHANCED TWO-DIMENSIONAL FERROMAGNETIC MOMENTS ON METALLIC OVERLAYERS, INTERFACES, AND SUPERLATTICES [J].

FU, CL ;

FREEMAN, AJ ;

OGUCHI, T .

PHYSICAL REVIEW LETTERS, 1985, 54 (25) :2700-2703

[8]

FU CY, COMMUNICATION

[9] OBSERVATION OF CHANGES IN THE ELECTRONIC-STRUCTURE ON NORMAL AND RECONSTRUCTED AU(100) USING ANGLE-RESOLVED PHOTOEMISSION [J].

HEIMANN, P ;

HERMANSON, J ;

MIOSGA, H ;

NEDDERMEYER, H .

PHYSICAL REVIEW LETTERS, 1979, 43 (23) :1757-1760

[10] OBSERVATION OF A TRUE INTERFACE STATE IN STRAINED-LAYER CU ADSORPTION ON RU (0001) [J].

HOUSTON, JE ;

PEDEN, CHF ;

FEIBELMAN, PJ ;

HAMANN, DR .

PHYSICAL REVIEW LETTERS, 1986, 56 (04) :375-377

← 1 2 3 →