INFLUENCE OF STRUCTURE OF THIN SILVER FILMS ON OPTICAL CONSTANTS NEAR PLASMA FREQUENCY

被引：9

作者：

SCHRODER, E

机构：

来源：

ZEITSCHRIFT FUR PHYSIK | 1969年 / 222卷 / 01期

关键词：

D O I：

10.1007/BF01393243

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

The optical constants of thin silver films are determined from transmission measurements in the range of the plasma frequency Ωp. Furthermore the structure of these films and its dependence on substrate temperature and film thickness is investigated by means of electron microscope. It is found, that the grain size influences the optical constants and consequently the position of Ωp. Herewith some discrepancies in the results of different authors can be cleared. © 1969 Springer-Verlag.

引用

页码：33 / &

共 16 条

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