HOLOGRAPHIC INTERFEROMETRY APPLIED TO MEASUREMENTS OF SMALL STATIC DISPLACEMENTS OF DIFFUSELY REFLECTING SURFACES

被引:97
作者
SOLLID, JE
机构
[1] General Dynamics, Fort Worth, TX, 76101
关键词
D O I
10.1364/AO.8.001587
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A general relation is derived by which small displacements of a diffusely reflecting surface may be determined using holographic interferometry. It is shown how a single hologram method of analysis, utilizing parallax and fringe counting, and a multiple hologram method, using interference order assignment are related. Both methods may be viewed in a unified manner. The requirements for application of both methods are discussed. © 1969 Optical Society of America.
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页码:1587 / +
页数:1
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