PHOTO-ELECTRIC SCANNING (6.65-M) SPECTROMETER FOR VUV CROSS-SECTION MEASUREMENTS

被引：34

作者：

YOSHINO, K

FREEMAN, DE

PARKINSON, WH

机构：

来源：

APPLIED OPTICS | 1980年 / 19卷 / 01期

关键词：

D O I：

10.1364/AO.19.000066

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

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页码：66 / 71

页数：6

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