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X-RAY PHOTOELECTRON-SPECTROSCOPY OF DIELECTRIC FILMS OF CEO2, CEO2/CD, AND CEO2/SIO PREPARED BY THERMAL EVAPORATION

被引：8
作者：
ALDHHAN, ZT
HASHEMI, T
HOGARTH, CA
机构：
来源：
SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY | 1989年 / 44卷 / 02期
关键词：
D O I：
10.1016/0584-8547(89)80022-9
中图分类号：
O433 [光谱学];
学科分类号：
0703 ; 070302 ;
摘要：
引用
收藏
页码：205 / 208
页数：4
相关论文
共 6 条
[1]   THE OPTICAL-ABSORPTION EDGE IN THIN AMORPHOUS OXIDE-FILMS BASED ON CERIUM DIOXIDE [J].
ALDHHAN, ZT ;
HOGARTH, CA ;
RIDDLESTON, N .
PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1988, 145 (01) :145-149
[2]   4F-LEVEL AND CORE-LEVEL PHOTOEMISSION SATELLITES IN CERIUM COMPOUNDS [J].
FUJIMORI, A .
PHYSICAL REVIEW B, 1983, 27 (07) :3992-4001
[3]  
HASHEMI T, IN PRESS J MATER SCI
[4]   OPTICAL-ABSORPTION IN THIN-FILMS OF CERIUM DIOXIDE AND CERIUM DIOXIDE CONTAINING SILICON MONOXIDE [J].
HOGARTH, CA ;
ALDHHAN, ZT .
PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1986, 137 (02) :K157-K160
[5]  
HOGARTH CA, 1968, P INT C PHYS SEMICON, P1278
[6]   X-RAY PHOTOELECTRON-SPECTROSCOPY OF A CERIUM-DOPED LANTHANUM ALUMINOSILICATE GLASS [J].
SEKITA, M ;
FUJIMORI, A ;
MAKISHIMA, A ;
SHIMOHIRA, T ;
OHASHI, H .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 1985, 76 (2-3) :399-407
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