HIGH-RESOLUTION PHOTOELECTRON SPECTROMETRY OF SELECTED NS' AND ND' AUTOIONIZATION RESONANCES IN AR, KR, AND XE

被引：71

作者：

WU, JZ

WHITFIELD, SB

CALDWELL, CD

KRAUSE, MO

VANDERMEULEN, P

FAHLMAN, A

机构：

[1] OAK RIDGE NATL LAB, OAK RIDGE, TN 37831 USA

[2] LINKOPING INST TECHNOL, S-58183 LINKOPING, SWEDEN

来源：

PHYSICAL REVIEW A | 1990年 / 42卷 / 03期

关键词：

D O I：

10.1103/PhysRevA.42.1350

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Photoionization cross sections () and photoelectron angular distribution parameters () across the (ns,nd) autoionization resonances for Ar, Kr, and Xe have been measured with photon resolution widths as low as 0.023 by means of synchrotron-based photoelectron spectroscopy. The experimental results are compared with those obtained by other experimental techniques and theoretical results. The enhanced resolution allows a redetermination of the width of the ns resonances. © 1990 The American Physical Society.

引用

页码：1350 / 1357

页数：8

共 38 条

[1]

Berkowitz J., 1979, PHOTOABSORPTION PHOT

[2] About the absorption series of argon, krypton and xenon to the term of ionisation boudaries between (2)P(3/2)(0) and (2)P(1/2)(0) [J].