VARIATION IN PROTON-INDUCED UPSETS RATES FROM LARGE SOLAR-FLARES USING AN IMPROVED SEU MODEL

被引:15
作者
NORMAND, E [1 ]
STAPOR, WJ [1 ]
机构
[1] USN,RES LAB,WASHINGTON,DC 20375
关键词
D O I
10.1109/23.101213
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Proton integral flux measurements during solar energetic particle (SEP) events, from the CPME instrument onboard the IMP-8 satellite, and the proton detector on the GOES-7 satellite, were utilized to calculate proton-induced SEU. An improved two-parameter SEU cross section model was used for three RAM devices. The log of the 239 actual RAM upsets on the TDRS-1 satellite during the Oct. 19, 1989 SEP event allowed a comparison between the recorded number of upset/chip per day, and those predicted based on the GOES-7 data, the 2-parameter model and the shielding distribution curve. © 1990 IEEE
引用
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页码:1947 / 1952
页数:6
相关论文
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