ORIGIN OF ANISOTROPY INHOMOGENEITY IN THIN PERMALLOY FILMS

被引:8
作者
UCHIYAMA, S
FUJII, T
MASUDA, M
SAKAKI, Y
机构
[1] Department of Electrical Engineering, Nagoya University, Nagoya
关键词
D O I
10.1109/TMAG.1968.1066213
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Inhomogeneity of induced uniaxial anisotropy in evaporated Permalloy thin films is found to be divided roughly into two classes, namely, intrinsic and extrinsic inhomogeneities. The former, which is the short wavelength component of the anisotropy change and results in the magnetization ripple, is found to originate mainly from the randomly oriented magnetocrystalline anisotropy and the magnetoelastic anisotropy in crystallites. The latter, the long wavelength component of the anisotropy change, seems to result from the same origin as that of the skew. Annealing experiments of the intrinsic angular dispersion showed that the activation energy of the relaxation process was about 0.5 eV. This result suggests that the magnetoelastic anisotropy originates mostly from the stress due to divacancies and/or dislocations. © 1968, IEEE. All rights reserved.
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页码:495 / &
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