CONFIGURATION OF ATOMIC DEFECTS FROM HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY

被引：3

作者：

COWLEY, JM

机构：

来源：

JOURNAL OF NUCLEAR MATERIALS | 1978年 / 69-7卷 / 1-2期

关键词：

D O I：

10.1016/0022-3115(78)90246-5

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：228 / 239

页数：12

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