SIMPLE ELECTRONIC SCANNING SYSTEM FOR THE X-RAY MICROANALYSER

被引：5

作者：

BERNARD, A

BRYSONHAYNES, D

MULVEY, T

机构：

来源：

JOURNAL OF SCIENTIFIC INSTRUMENTS | 1959年 / 36卷 / 10期

关键词：

D O I：

10.1088/0950-7671/36/10/310

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：438 / 444

页数：7

共 16 条

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[3]

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[4]

Castaing R, 1951, P EL PHYS, V527, P305

[5]

CASTAING R, 1950, 1949 P C EL MICR DEL

[6]

COSSLETT VE, 1957, XRAY MICROSCOPY MICR, P375

[7] THE ORIGIN OF SPECIMEN CONTAMINATION IN THE ELECTRON MICROSCOPE [J].

ENNOS, AE .

BRITISH JOURNAL OF APPLIED PHYSICS, 1953, 4 (APR) :101-106

[8]

HAINE ME, 1954, P INT C ELECTRON MIC

[9] A GEIGER COUNTER X-RAY CRYSTAL SPECTROMETER [J].

MCKEOWN, PJA ;

UBBELOHDE, AR .

JOURNAL OF SCIENTIFIC INSTRUMENTS, 1954, 31 (09) :321-326

[10] AN IMPROVED SCANNING ELECTRON MICROSCOPE FOR OPAQUE SPECIMENS [J].

MCMULLAN, D ;

THEWLIS, J ;

AGAR, AW ;

GABOR, D ;

HAINE, ME ;

LUBSZYNSKI, HG ;

FEINBERG, R ;

MCMULLAN, D .

PROCEEDINGS OF THE INSTITUTION OF ELECTRICAL ENGINEERS-LONDON, 1953, 100 (75) :245-259

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