CURRENT FLUCTUATIONS FROM VARIOUS CRYSTAL FACES OF A CLEAN TUNGSTEN FIELD EMITTER

[1] FIELD ION MICROSCOPE STUDIES OF TRANSITION METAL ADATOM DIFFUSION ON (110), (211) AND (321) TUNGSTEN SURFACES [J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1970, 3 (05) : 707 - &

[2] CONCENTRATION FLUCTUATIONS IN ADSORBED LAYERS [J]. SURFACE SCIENCE, 1976, 55 (02) : 494 - 508

[3] ADSORPTION OF TUNGSTEN ON STEPPED TUNGSTEN SURFACES STUDIED BY WORK FUNCTION MEASUREMENT [J]. SURFACE SCIENCE, 1975, 53 (DEC) : 351 - 358

[4] BESOCKE K, 1973, PHYS REV B, V8, P4597, DOI 10.1103/PhysRevB.8.4597

[5] ACTIVATION ENERGY FOR THE SURFACE MIGRATION OF TUNGSTEN IN THE PRESENCE OF A HIGH-ELECTRIC FIELD [J]. PHYSICAL REVIEW, 1960, 119 (01): : 85 - 93

[6] BONZEL HP, 1975, CRC CRITICAL REV SOL, V6, P171

[7] SIMPLE METHOD FOR DERIVING, FROM MEASURED I(V) DATA, INFORMATION ON GEOMETRY OF A FIELD EMISSION CURRENT SOURCE OF UNKNOWN CHARACTERISTICS [J]. JOURNAL OF APPLIED PHYSICS, 1962, 33 (05) : 1897 - &

[8] THE FIELD EMITTER - FABRICATION, ELECTRON MICROSCOPY, AND ELECTRIC FIELD CALCULATIONS [J]. JOURNAL OF APPLIED PHYSICS, 1953, 24 (05) : 570 - 576

[9] ATOMIC VIEW OF SURFACE SELF-DIFFUSION - TUNGSTEN ON TUNGSTEN [J]. JOURNAL OF CHEMICAL PHYSICS, 1966, 44 (03) : 1039 - &

[10] CURRENT FLUCTUATIONS FROM SMALL REGIONS OF ADSORBATE COVERED FIELD EMITTERS - METHOD FOR DETERMINING DIFFUSION-COEFFICIENTS ON SINGLE-CRYSTAL PLANES [J]. SURFACE SCIENCE, 1973, 38 (02) : 373 - 393

[1] FIELD ION MICROSCOPE STUDIES OF TRANSITION METAL ADATOM DIFFUSION ON (110), (211) AND (321) TUNGSTEN SURFACES [J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1970, 3 (05) : 707 - &

[2] CONCENTRATION FLUCTUATIONS IN ADSORBED LAYERS [J]. SURFACE SCIENCE, 1976, 55 (02) : 494 - 508

[3] ADSORPTION OF TUNGSTEN ON STEPPED TUNGSTEN SURFACES STUDIED BY WORK FUNCTION MEASUREMENT [J]. SURFACE SCIENCE, 1975, 53 (DEC) : 351 - 358

[4] BESOCKE K, 1973, PHYS REV B, V8, P4597, DOI 10.1103/PhysRevB.8.4597

[5] ACTIVATION ENERGY FOR THE SURFACE MIGRATION OF TUNGSTEN IN THE PRESENCE OF A HIGH-ELECTRIC FIELD [J]. PHYSICAL REVIEW, 1960, 119 (01): : 85 - 93

[6] BONZEL HP, 1975, CRC CRITICAL REV SOL, V6, P171

[7] SIMPLE METHOD FOR DERIVING, FROM MEASURED I(V) DATA, INFORMATION ON GEOMETRY OF A FIELD EMISSION CURRENT SOURCE OF UNKNOWN CHARACTERISTICS [J]. JOURNAL OF APPLIED PHYSICS, 1962, 33 (05) : 1897 - &

[8] THE FIELD EMITTER - FABRICATION, ELECTRON MICROSCOPY, AND ELECTRIC FIELD CALCULATIONS [J]. JOURNAL OF APPLIED PHYSICS, 1953, 24 (05) : 570 - 576

[9] ATOMIC VIEW OF SURFACE SELF-DIFFUSION - TUNGSTEN ON TUNGSTEN [J]. JOURNAL OF CHEMICAL PHYSICS, 1966, 44 (03) : 1039 - &

[10] CURRENT FLUCTUATIONS FROM SMALL REGIONS OF ADSORBATE COVERED FIELD EMITTERS - METHOD FOR DETERMINING DIFFUSION-COEFFICIENTS ON SINGLE-CRYSTAL PLANES [J]. SURFACE SCIENCE, 1973, 38 (02) : 373 - 393