INFLUENCE OF ELECTRODE MACROSCOPIC CURVATURE UPON SURFACE-ROUGHNESS EFFECTS IN COMPRESSED SF6

被引：13

作者：

MCALLISTER, IW

机构：

来源：

ARCHIV FUR ELEKTROTECHNIK | 1980年 / 62卷 / 01期

关键词：

D O I：

10.1007/BF01578116

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：43 / 49

页数：7

共 18 条

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