MILLIMETER WAVE COMPLEX REFLECTION COEFFICIENT SCANNER

被引：1

作者：

GOTTFRIED, S ^{[1
]}

机构：

[1] BELL TEL LABS INC, HOLMDEL, NJ 07733 USA

来源：

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 1973年 / IM22卷 / 04期

关键词：

D O I：

10.1109/TIM.1973.4314182

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：325 / 330

页数：6

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[1] 33-110-GHZ MILLIMETER-WAVE LOSS SCANNER
CANADA, CE
[J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1971, IM20 (04) : 332 - &
[2] FREQUENCY RESPONSE OF INPUT IMPEDANCE IMPLIES DISTRIBUTION OF DISCONTINUITIES OF A TRANSMISSION-LINE SYSTEM
DETLEFSE.J
[J]. ELECTRONICS LETTERS, 1970, 6 (03) : 67 - &
[3] COMPARISON REFLECTOMETER
HOLLWAY, DL
[J]. IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1967, MT15 (04) : 250 - &
[4] A HIGH-RESOLUTION SWEPT-FREQUENCY REFLECTOMETER
HOLLWAY, DL
SOMLO, PI
[J]. IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1969, MT17 (04) : 185 - &
[5] AN OSCILLOGRAPHIC METHOD OF PRESENTING IMPEDANCES ON THE REFLECTION-COEFFICIENT PLANE
SAMUEL, AL
[J]. PROCEEDINGS OF THE INSTITUTE OF RADIO ENGINEERS, 1947, 35 (11): : 1279 - 1283
[6] LOCATING REFLECTOMETER
SOMLO, PI
[J]. IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1972, MT20 (02) : 105 - &