ANOMALOUS RESISTANCE OF PURE GALLIUM NEAR 1.7 DEGREES K

[1] EDDY-CURRENT METHOD FOR MEASURING THE RESISTIVITY OF METALS [J]. JOURNAL OF APPLIED PHYSICS, 1959, 30 (12) : 1976 - 1980

[2] MEAN FREE PATH OF ELECTRONS AND MAGNETOMORPHIC EFFECTS IN SMALL SINGLE CRYSTALS OF GALLIUM .2. [J]. PHYSICAL REVIEW, 1965, 140 (6A): : 2174 - &

[3] GORTER CJ, 1964, PROGRESS LOW TEMP ED, V4, P194

[4] Gurzhi, 1965, ZH EKSP TEOR FIZ, V47, P1415

[5] GURZHI RN, 1965, SOV PHYS JETP-USSR, V20, P953

[6] ULTRASENSITIVE POTENTIOMETER FOR USE AT LIQUID HELIUM TEMPERATURES [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1966, 37 (11) : 1602 - &

[7] MEADEN GI, 1965, ELECTRICAL RESISTANC

[8] CYCLOTRON RESONANCE LINEWIDTHS AND ELECTRON RELAXATION TIMES IN GALLIUM [J]. PHYSICAL REVIEW LETTERS, 1966, 16 (13) : 581 - &

[9] VANDENBERG GJ, 1964, PROGRESS LOW TEMPERA, V4, P194

[10] TEMPERATURE DEPENDENCE OF ELECTRON SCATTERING IN THIN SINGLE CRYSTAL FILMS OF GALLIUM AT HE TEMPERATURES [J]. PHYSICS LETTERS, 1966, 23 (07): : 423 - &

[1] EDDY-CURRENT METHOD FOR MEASURING THE RESISTIVITY OF METALS [J]. JOURNAL OF APPLIED PHYSICS, 1959, 30 (12) : 1976 - 1980

[2] MEAN FREE PATH OF ELECTRONS AND MAGNETOMORPHIC EFFECTS IN SMALL SINGLE CRYSTALS OF GALLIUM .2. [J]. PHYSICAL REVIEW, 1965, 140 (6A): : 2174 - &

[3] GORTER CJ, 1964, PROGRESS LOW TEMP ED, V4, P194

[4] Gurzhi, 1965, ZH EKSP TEOR FIZ, V47, P1415

[5] GURZHI RN, 1965, SOV PHYS JETP-USSR, V20, P953

[6] ULTRASENSITIVE POTENTIOMETER FOR USE AT LIQUID HELIUM TEMPERATURES [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1966, 37 (11) : 1602 - &

[7] MEADEN GI, 1965, ELECTRICAL RESISTANC

[8] CYCLOTRON RESONANCE LINEWIDTHS AND ELECTRON RELAXATION TIMES IN GALLIUM [J]. PHYSICAL REVIEW LETTERS, 1966, 16 (13) : 581 - &

[9] VANDENBERG GJ, 1964, PROGRESS LOW TEMPERA, V4, P194

[10] TEMPERATURE DEPENDENCE OF ELECTRON SCATTERING IN THIN SINGLE CRYSTAL FILMS OF GALLIUM AT HE TEMPERATURES [J]. PHYSICS LETTERS, 1966, 23 (07): : 423 - &