TEST-RETEST RELIABILITY STUDY OF THE WECHSLER ADULT INTELLIGENCE SCALE

被引：8

作者：

BROWN, HSR

MAY, AE

机构：

[1] Mendip Hosp, Wells, England

来源：

JOURNAL OF CONSULTING AND CLINICAL PSYCHOLOGY | 1979年 / 47卷 / 03期

关键词：

test-retest reliability of WAIS; psychiatric patients;

D O I：

10.1037/0022-006X.47.3.601

中图分类号：

B849 [应用心理学];

学科分类号：

040203 ;

摘要：

The WAIS is one of the most widely used means for assessing intelligence, yet data on test-retest reliability are scarce. The test-retest IQs of 50 psychiatric patients (mean age 44 yrs) were correlated. The patients were not from any specific diagnostic group. They were included in the sample only because they had been given the WAIS before. The interval between test and retest averaged almost 2 yrs. All test-retest correlations were .90 or over. (5 ref) (PsycINFO Database Record (c) 2006 APA, all rights reserved). © 1979 American Psychological Association.

引用

页码：601 / 602

页数：2