THICKNESS DEPENDENCE OF DOMAIN ORIENTATION IN THIN NICKEL FILMS

被引：3

作者：

KUWAHARA, K

GOTO, M

机构：

来源：

关键词：

D O I：

10.1143/JPSJ.15.359

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：359 / 359

页数：1

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共 3 条

[1] THE CAUSE OF STRESS IN EVAPORATED METAL FILMS
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DANIELS, RD
CRITTENDEN, EC
[J]. PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B, 1954, 67 (414): : 497 - 500
[2] THEORY OF THE STRUCTURE OF FERROMAGNETIC DOMAINS IN FILMS AND SMALL PARTICLES
KITTEL, C
[J]. PHYSICAL REVIEW, 1946, 70 (11-1): : 965 - 971
[3] CURIE POINT IN THIN NI FILMS DETERMINED BY ELECTRICAL METHOD
KUWAHARA, K
[J]. JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1959, 14 (09) : 1247 - 1247