HIGHLIGHT-LINE ALGORITHM FOR REALTIME SURFACE-QUALITY ASSESSMENT

被引：66

作者：

BEIER, KP

CHEN, YF

机构：

[1] Department of Naval Architecture and Marine Engineering, University of Michigan, Ann Arbor, MI 48109-2145, 2600 Draper, NA and ME Building

来源：

COMPUTER-AIDED DESIGN | 1994年 / 26卷 / 04期

关键词：

COMPUTER-AIDED GEOMETRIC DESIGN; SURFACE-SMOOTHNESS INDICATORS; HIGHLIGHT LINES; CONTOURING;

D O I：

10.1016/0010-4485(94)90073-6

中图分类号：

TP31 [计算机软件];

学科分类号：

081202 ; 0835 ;

摘要：

A new method of surface-quality assessment is presented. The model of highlight lines is introduced, and its properties and applications in surface-quality evaluation are demonstrated. The differential equation of the highlight-line model is derived, and the difficulty involved in seeking its analytical solutions is discussed. Alternatively, the creation of highlight lines is formulated as a surface-plane intersection problem, and solved using surface-contouring techniques. A fast highlight-line algorithm is developed utilizing an efficient traced contouring technique. The algorithm is robust, fully automatic, and, therefore, well suited for realtime quality-assessment tasks.

引用

页码：268 / 277

页数：10

共 10 条

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