MECHANISM OF PASSIVATION OF NICKEL AS DETERMINED BY AN AUTOMATIC RECORDING ELLIPSOMETER

被引：21

作者：

REDDY, AKN

RAO, B

机构：

来源：

CANADIAN JOURNAL OF CHEMISTRY | 1969年 / 47卷 / 14期

关键词：

D O I：

10.1139/v69-442

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

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页码：2693 / &

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[1] AN ELLIPSOMETRIC DETERMINATION OF MECHANISM OF PASSIVITY OF NICKEL
BOCKRIS, JO
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[J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1966, 113 (11) : 1133 - &
[2] RAO B, 1966, THESIS U PENNSYLVANI
[3] RAO BVN, TO BE PUBLISHED
[4] READY AKN, 1964, 256 US NATL BUR STD, P229
[5] ELLIPSOMETRIC DETERMINATION OF FILM THICKNESS AND CONDUCTIVITY DURING PASSIVATION PROCESS ON NICKEL
REDDY, AKN
RAO, MGB
BOCKRIS, JOM
[J]. JOURNAL OF CHEMICAL PHYSICS, 1965, 42 (06) : 2246 - &
[6] REDDY AKN, TO BE PUBLISHED