SOLID-STATE BANDPASS DETECTOR FOR INVERSE-PHOTOEMISSION SPECTROSCOPY

被引:13
作者
SHEILS, W
LECKEY, RCG
RILEY, JD
机构
[1] Department of Physics, La Trobe University, Bundoora
关键词
D O I
10.1063/1.1144117
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
This paper presents the details of a new arrangement for the bandpass detection of radiation in the vacuum ultraviolet region. The detector is based on two wide bandpass filters that share the diminishing quantum efficiency of a microchannel plate as their common low-energy cutoff, but have high-energy cutoffs determined by the transmittance limits of different crystal windows. The detector has been used to perform an inverse photoemission experiment on a sample of polycrystalline gold. From the results of this experiment the detector is estimated to have a bandpass centered at 11.4 eV and a resolution of 0.57 eV.
引用
收藏
页码:1194 / 1198
页数:5
相关论文
共 30 条
[1]   EMPTY ELECTRONIC STATES IN THE SODIUM TUNGSTEN BRONZES - A STUDY BY INVERSE PHOTOEMISSION SPECTROSCOPY [J].
ALLEN, PMG ;
DOBSON, PJ ;
EGDELL, RG .
SOLID STATE COMMUNICATIONS, 1985, 55 (08) :701-704
[2]  
ANDREWS PT, 1988, VACUUM, V38, P257, DOI 10.1016/0042-207X(88)90056-5
[3]  
Avci R., 1989, Review of Scientific Instruments, V60, P3643, DOI 10.1063/1.1140469
[4]  
CHILDS TT, 1984, REV SCI INSTRUM, V55, P812
[5]   VUV ISOCHROMAT SPECTROMETER FOR SURFACE-ANALYSIS [J].
DENNINGER, G ;
DOSE, V ;
SCHEIDT, H .
APPLIED PHYSICS, 1979, 18 (04) :375-380
[6]   TOPICS IN INVERSE PHOTOEMISSION [J].
DOSE, V .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 1987, 5 (04) :2032-2037
[7]   VUV ISOCHROMAT SPECTROSCOPY [J].
DOSE, V .
APPLIED PHYSICS, 1977, 14 (01) :117-118
[8]   NORMAL-INCIDENCE GRATING SPECTROGRAPH WITH LARGE ACCEPTANCE FOR INVERSE PHOTOEMISSION [J].
FAUSTER, T ;
STRAUB, D ;
DONELON, JJ ;
GRIMM, D ;
MARX, A ;
HIMPSEL, FJ .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1985, 56 (06) :1212-1214
[9]  
FUNNEMAN D, 1985, J PHYS E, V19, P554
[10]   EFFECTS OF A SIMULATED HIGH-ENERGY SPACE ENVIRONMENT ON ULTRAVIOLET TRANSMITTANCE OF OPTICAL MATERIALS BETWEEN 1050 A AND 3000 A [J].
HEATH, DF ;
SACHER, PA .
APPLIED OPTICS, 1966, 5 (06) :937-&