QUANTITATIVE X-RAY ENERGY DISPERSIVE ANALYSIS WITH TRANSMISSION ELECTRON-MICROSCOPE

被引：18

作者：

GEISS, RH ^{[1
]}

HUANG, TC ^{[1
]}

机构：

[1] IBM CORP,RES LAB,SAN JOSE,CA 95193

来源：

关键词：

D O I：

10.1002/xrs.1300040410

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

引用

页码：196 / 201

页数：6

共 12 条

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GEISS, RH ;

HUANG, TC .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1975, 12 (01) :140-143

[2]

HEINRICH KFJ, 1972, 7TH P MAS C SAN FRAN, P3

[3]

Henke B.L., 1974, ADV XRAY ANALYSIS, V17, P150

[4]

HENRY NF, 1969, INT TABLES XRAY CRYS, V3, P157

[5]

HUANG TC, 1975, APPL PHYS LETT, V27, P123, DOI 10.1063/1.88404

[6]

KIRKENDALL TD, 1974, 9TH ANN C MICR AN SO, P24

[7]

LIFSHIN E, 1975, PRACTICAL SCANNING E, pCH7

[8]

MYKLEBUST RL, 1971, ENERGY DISPERSION XR, P232

[9] A SIMPLEX-METHOD FOR FUNCTION MINIMIZATION [J].

NELDER, JA ;

MEAD, R .

[10]

PHILIBERT J, 1971, 6TH P INT C XRAY OPT, P71