1ST-PRINCIPLES THEORY OF ATOM EXTRACTION BY SCANNING-TUNNELING-MICROSCOPY

被引：88

作者：

HIROSE, K

TSUKADA, M

机构：

[1] Department of Physics, Faculty of Science, University of Tokyo, Bunkyo-ku, Tokyo 113

来源：

PHYSICAL REVIEW LETTERS | 1994年 / 73卷 / 01期

关键词：

D O I：

10.1103/PhysRevLett.73.150

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

A new method to provide a self-consistent electronic structure, field, and current distribution for an atomistic bielectrode system with applied bias voltages is presented. In our method the scattering waves are calculated by a step-by-step recursion-matrix method and two different Fermi levels are assigned to each electrode in accord with a given applied bias voltage. The method is applied to the scanning tunneling microscope (STM) system around the contact region. The tip-surface chemical interaction induced by the electric fields is shown to be important for the extreme specificity of atom extraction by STM.

引用

页码：150 / 153

页数：4

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