ELECTRONIC SUSCEPTIBILITY OF NIOBIUM

被引：24

作者：

COOKE, JF ^{[1
]}

DAVIS, HL ^{[1
]}

MOSTOLLER, M ^{[1
]}

机构：

[1] OAK RIDGE NATL LAB, SOLID STATE DIV, OAK RIDGE, TN 37830 USA

来源：

PHYSICAL REVIEW B | 1974年 / 9卷 / 06期

关键词：

D O I：

10.1103/PhysRevB.9.2485

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：2485 / 2489

页数：5

共 30 条

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