X-RAY PHOTOELECTRON SPECTROSCOPIC (XPS) INVESTIGATIONS OF ETCHING AND ANNEALING EFFECTS ON THIN-FILMS OF MOO3

被引:9
作者
ANWAR, M [1 ]
HOGARTH, CA [1 ]
KHAN, GA [1 ]
BULPETT, R [1 ]
机构
[1] BRUNEL UNIV,CTR EXPTL TECHNIQUES,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
关键词
D O I
10.1016/0584-8547(89)80077-1
中图分类号
O433 [光谱学];
学科分类号
0703 ; 070302 ;
摘要
引用
收藏
页码:789 / 793
页数:5
相关论文
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