共 1 条
- [1] Oatley C.W., 1957, J ELECTRON CONTR, V2, P568
ISOLATION OF POTENTIAL CONTRAST IN SCANNING ELECTRON MICROSCOPE
被引：34
作者：
OATLEY, CW
机构：
来源：
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS
|
1969年
/
2卷
/
08期
关键词：
D O I：
10.1088/0022-3735/2/8/440
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ;
080401 ;
081102 ;
摘要：
Contrast in a scanning electron microscope can arise from potential variations on the surface of the specimen or from a number of other causes such as the topography of the surface. A method is described whereby contrast resulting from potential variations on the specimen appears in the final display, whereas contrast arising from other mechanisms is almost completely cancelled.
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页码：742 / &
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