AN ELECTRON DIFFRACTION STUDY OF ZINC TELLURIDE AND ZINC SELENIDE FILMS

被引：10

作者：

DHERE, NG

GOSWAMI, A

机构：

[1] National Chemical Laboratory, Poona

来源：

THIN SOLID FILMS | 1969年 / 3卷 / 06期

关键词：

D O I：

10.1016/0040-6090(69)90058-3

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Structures of vacuum deposited films of ZnTe and ZnSe grown on different faces of rocksalts, cleavage face of mica and also on amorphous substrates at various substrate temperatures have been studied by electron diffraction. The deposits grew epitaxially on all single crystal substrate at suitable substrate temperatures. Often more than one orientation as well as a hexagonal phase were observed and these were associated with growth faults of the deposits. © 1969.

引用

页码：439 / &

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