学术探索
学术期刊
新闻热点
数据分析
智能评审

BIAS-DEPENDENT STM IMAGES OF OXYGEN-INDUCED STRUCTURES ON TI(0001) FACETS

被引：9
作者：
BERNDT, R
GIMZEWSKI, JK
SCHLITTLER, RR
机构：
[1] IBM Research Division, Zurich Research Laboratory
来源：
SURFACE SCIENCE | 1994年 / 310卷 / 1-3期
关键词：
D O I：
10.1016/0039-6028(94)91373-0
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
Titanium films grown on Si(111) surfaces in ultrahigh vacuum were investigated using scanning tunneling microscopy (STM). STM images of adsorbate structures induced by oxygen adsorption on Ti(0001) facets are observed to change from protrusions to depressions depending on the applied bias voltage. Using electron spectroscopic data we interpret our results in terms of local, oxygen-induced modifications of the density of states.
引用
收藏
页码：85 / 88
页数：4
相关论文
共 18 条
[1]  
ARLINGHAUS FJ, 1980, TOP CURR PHYS, V19, P71
[2]  
BEHM RJ, 1990, SCANNING TUNNELING M, P173
[3]   ENHANCED PHOTON-EMISSION FROM THE STM - A GENERAL PROPERTY OF METAL-SURFACES [J].
BERNDT, R ;
GIMZEWSKI, JK ;
SCHLITTLER, RR .
ULTRAMICROSCOPY, 1992, 42 :355-359
[4]  
BERNDT R, 1991, J VAC SCI TECHNOL B, V9, P897
[5]   ELECTRON-EMISSION AND ION DESORPTION SPECTROSCOPY OF CLEAN AND OXIDIZED TI(0001) [J].
BERTEL, E ;
STOCKBAUER, R ;
MADEY, TE .
SURFACE SCIENCE, 1984, 141 (2-3) :355-387
[6]   A PHOTOELECTRON AND ENERGY-LOSS SPECTROSCOPY STUDY OF TI AND ITS INTERACTION WITH H-2, O-2, N-2 AND NH3 [J].
BIWER, BM ;
BERNASEK, SL .
SURFACE SCIENCE, 1986, 167 (01) :207-230
[7]   DIRECT IMAGING OF ADSORPTION SITES AND LOCAL ELECTRONIC-BOND EFFECTS ON A METAL-SURFACE - C/AL(111) [J].
BRUNE, H ;
WINTTERLIN, J ;
ERTL, G ;
BEHM, RJ .
EUROPHYSICS LETTERS, 1990, 13 (02) :123-128
[8]   IMAGING XE WITH A LOW-TEMPERATURE SCANNING TUNNELING MICROSCOPE [J].
EIGLER, DM ;
WEISS, PS ;
SCHWEIZER, EK ;
LANG, ND .
PHYSICAL REVIEW LETTERS, 1991, 66 (09) :1189-1192
[9]  
Feenstra R., 1990, SCANNING TUNNELING M, P211
[10]   A COMPARATIVE-STUDY OF OXIDATION OF TI AND COTI BY HREELS AND XPS [J].
GARRETT, SJ ;
EGDELL, RG ;
RIVIERE, JC .
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1990, 54 :1065-1074
12