DYNAMIC STUDIES OF DEFECT MOBILITY USING HIGH-VOLTAGE ELECTRON-MICROSCOPY

被引:136
作者
KIRITANI, M
TAKATA, H
机构
关键词
D O I
10.1016/0022-3115(78)90249-0
中图分类号
T [工业技术];
学科分类号
08 ;
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页码:277 / 309
页数:33
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