STUDY OF CHEMICALLY-ETCHED BI2SR2-XCA1+XCU2O8+DELTA SURFACES

被引：16

作者：

VASQUEZ, RP

HOUSLEY, RM

机构：

[1] ROCKWELL INT CORP,CTR SCI,THOUSAND OAKS,CA 91360

[2] CALTECH,DEPT PHYS,PASADENA,CA 91125

来源：

PHYSICA C | 1991年 / 175卷 / 3-4期

基金：

美国国家航空航天局;

关键词：

D O I：

10.1016/0921-4534(91)90592-M

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

X-ray photoelectron spectroscopy (XPS) and scanning electron microscopy (SEM) are used to characterize the surfaces of polycrystalline Bi2Sr(2-x)Ca(1+x)Cu2O8+delta thin films which have been chemically etched in a solution of Br2 in absolute ethanol. XPS measurements from individual grains (approximately 1 mm2) are obtained, and the spectra presented here are comparable to spectra in the literature obtained from single crystals cleaved in vacuum. XPS valence band spectra show a clear Fermi edge, indicating that the room temperature conductivity near the surface is metallic. This is the first report of a detectable Fermi edge from a high temperature superconductor surface which has not been treated in vacuum.

引用

页码：233 / 240

页数：8

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