Probability of detection of internal voids in structural ceramics using microfocus radiography

被引：5

作者：

Baaklini, George Y. ^{[1
]}

Roth, Don J. ^{[2
]}

机构：

[1] Cleveland State Univ, Cleveland, OH 44115 USA

[2] NASA, Lewis Res Ctr, Cleveland, OH 44135 USA

来源：

JOURNAL OF MATERIALS RESEARCH | 1986年 / 1卷 / 03期

关键词：

D O I：

10.1557/JMR.1986.0457

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The reliability of microfocus x radiography for detecting internal voids in structural ceramic test specimens was statistically evaluated. The microfocus system was operated in the projection mode using low x-ray photon energies (<= 20 keV) and a 10 mu m focal spot. The statistics were developed for implanted internal voids in green and sintered silicon carbide and silicon nitride test specimens. These statistics were compared with previously obtained statistics for implanted surface voids in similar specimens. Problems associated with void implantation and characterization are discussed. Statistical results are given as probability-of-detection curves at a 95% confidence level for voids ranging in size from 20-528 mu m in diameter.

引用

页码：457 / 467

页数：11

共 26 条

[1]

[Anonymous], 1970, RAD HLTH HDB US DEP, P137

[2]

[Anonymous], 1984, TM86945 NASA

[3]

Baaklini G. Y., 1986, ADV CERAM MATER, V1, P43

[4] SINTERABILITY, STRENGTH AND OXIDATION OF ALPHA-SILICON CARBIDE POWDERS [J].

DUTTA, S .

JOURNAL OF MATERIALS SCIENCE, 1984, 19 (04) :1307-1313

[5]

Evans A. G., 1984, Defect Properties and Processing of High-Technology Nonmetallic Materials. Proceedings of the Symposium, P63

[6]

EVANS AG, 1977, MATER EVAL, V35, P85

[7]

Hall W. B., 1985, RES REPORTS 1984 NAS

[8]

HALMSHAW R, 1982, IND RADIOLOGY

[9]

Harper J. E., 1983, CERAMICS HIGH PERFOR, P645

[10]

KHANDELWAL PK, 1985, AM CERAM SOC BULL, V64, P1112

← 1 2 3 →