PREDICTING ABSOLUTE SENSITIVITY AND LIMIT OF DETECTION FOR X-RAY ANALYSIS OF POLLUTION SAMPLES

被引：10

作者：

BIRKS, LS ^{[1
]}

机构：

[1] USN,RES LAB,WASHINGTON,DC 20375

来源：

关键词：

D O I：

10.1021/ac50019a012

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：1505 / 1507

页数：3

共 6 条

[1] MEASUREMENT AND CALCULATION OF ABSOLUTE INTENSITIES OF X-RAY-SPECTRA
BROWN, DB
GILFRICH, JV
PECKERAR, MC
[J]. JOURNAL OF APPLIED PHYSICS, 1975, 46 (10) : 4537 - 4540
[2] ATOMIC FLUORESCENCE YIELDS
FINK, RW
JOPSON, RC
MARK, H
SWIFT, CD
[J]. REVIEWS OF MODERN PHYSICS, 1966, 38 (03) : 513 - &
[3] GILFRICH JV, 1975, APPL SPECTROSC, V29, P322, DOI 10.1366/000370275774455914
[4] International Union of Pure and Applied Chemistry, 1976, PURE APPL CHEM, V45, P99
[5] MCMASTER WH, 1969, UCRL50174 REP
[6] 1976, ANAL CHEM, V48, pR273