QUALITY ASSURANCE IN THE DETERMINATION OF OVERLAPPING PEAK AREAS

被引：11

作者：

CHRISTENSEN, LH

HEYDORN, K

机构：

来源：

JOURNAL OF RADIOANALYTICAL AND NUCLEAR CHEMISTRY-ARTICLES | 1987年 / 113卷 / 01期

关键词：

D O I：

10.1007/BF02036045

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：19 / 34

页数：16

共 12 条

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[10] PHOTOPEAK METHOD FOR COMPUTER ANALYSIS OF GAMMA-RAY SPECTRA FROM SEMICONDUCTOR DETECTORS [J].

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