PROPERTIES OF MULTILAYERS FOR SOFT-X-RAY OPTICS

被引：2

作者：

FALCO, CM

FERNANDEZ, FE

DHEZ, P

KHANDARSHAHABAD, A

机构：

[1] UNIV ARIZONA,XRAY OPT LAB,TUCSON,AZ 85721

[2] UNIV PARIS 11,UTILISAT RAYONNEMENT ELECTROMAGNET LAB,F-91405 ORSAY,FRANCE

来源：

SUPERLATTICES AND MICROSTRUCTURES | 1988年 / 4卷 / 01期

关键词：

D O I：

10.1016/0749-6036(88)90266-2

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

引用

页码：51 / 53

页数：3

共 10 条

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[3]

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[4] STRUCTURAL AND ELECTRONIC-PROPERTIES OF ARTIFICIAL METALLIC SUPERLATTICES [J].

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[5]

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[6]

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[7]

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[9]

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[10] A NEW STRUCTURE IN TANTALUM THIN FILMS (VAPOR DEPOSITION SUPERCONDUCTIVITY SPUTTERING X-RAY DIFFRACTION E) [J].

READ, MH ;

ALTMAN, C .

APPLIED PHYSICS LETTERS, 1965, 7 (03) :51-&

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