共 28 条
[1]
Ning, Cook, Dennard, Osburn, Schuster, Yu, 1 &
[2]
#181
[3]
m MOSFET VLSI technology: Part IV&
[4]
#8212
[5]
Hot-electron design constraints, IEEE Transactions on Electron Devices, 26, (1979)
[6]
Hofmann, Werner, Weber, Dorda, Appl. Phys. Lett., 52, (1985)
[7]
Saks, Heremans, Van Der Hove, Maes, De Keersmaecker, DeClerck, Observation of hot-hole injection in NMOS transistors using a modified floating-gate technique, IEEE Transactions on Electron Devices, 33, (1986)
[8]
Tsuchiya, IEE Trans. Electron Devices, ED, 34, (1987)
[9]
Heremans, Bellens, Groeseneken, Maes, IEEE Trans. Electron Devices, ED, 35, (1988)
[10]
Doyle, Bourcerie, Bregonzoni, Benecchi, Bravis, Mistry, Boudou, IEEE Trans. Electron Devices, ED, 37, (1990)