ELECTRON BEAM CHANNELING IN SINGLE-CRYSTAL SILICON BY SCANNING ELECTRON MICROSCOPY

被引：24

作者：

WOLF, ED

EVERHART, TE

机构：

来源：

APPLIED PHYSICS LETTERS | 1969年 / 14卷 / 10期

关键词：

D O I：

10.1063/1.1652657

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

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页码：299 / &

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[1] SOME COMMENTS ON INTERPRETATION OF KIKUCHI-LIKE REFLECTION PATTERNS OBSERVED BY SCANNING ELEECTRON MICROSCOPY
BOOKER, GR
SHAW, AMB
WHELAN, MJ
HIRSCH, PB
[J]. PHILOSOPHICAL MAGAZINE, 1967, 16 (144): : 1185 - &
[2] KIKUCHI-LIKE REFLECTION PATTERNS OBTAINED WITH SCANNING ELECTRON MICROSCOPE
COATES, DG
[J]. PHILOSOPHICAL MAGAZINE, 1967, 16 (144): : 1179 - &
[3] IMPROVEMENTS IN ORIENTATION EFFECT OBSERVED BY SCANNING ELECTRON MICROSCOPY
COATES, DG
[J]. PHYSICA STATUS SOLIDI, 1968, 27 (01): : K11 - &
[4] Scanning-Electron-Beam Anomalous Transmission Patterns
Holt, D. B.
Gavrilovic, J.
Jones, M. P.
[J]. JOURNAL OF MATERIALS SCIENCE, 1968, 3 (05) : 553 - 558