CHEMICAL ANALYSIS OF THIN FILMS BY X-RAY EMISSION SPECTROGRAPHY

[1] APPLICATIONS OF CURVED-CRYSTAL X-RAY SPECTROMETERS - MICROANALYSIS AND SIMULTANEOUS ANALYSIS [J]. ANALYTICAL CHEMISTRY, 1955, 27 (03) : 437 - 440

[2] BRISSEY RM, 1954, AM SOC TEST MATER, V157, P43

[3] CARL HF, 1954, AM SOC TEST MATER, V157, P63

[4] FRIEDMAN H, 1954, AM SOC TEST MATER, V157, P3

[5] METALLURGICAL APPLICATIONS OF X-RAY FLUORESCENT ANALYSIS [J]. JOURNAL OF APPLIED PHYSICS, 1952, 23 (04) : 427 - 433

[6] X-RAY ABSORPTION AND EMISSION [J]. ANALYTICAL CHEMISTRY, 1954, 26 (01) : 26 - 31

[7] MAHLA EM, 1948, J ELECTROCHEM SOC, V93, P339

[8] NOAKES GE, 1954, ASTM SPEC TECH PUBL, V157, P57

[9] TRACE ANALYSIS BY X-RAY EMISSION SPECTROGRAPHY [J]. NATURE, 1954, 174 (4426) : 397 - 397

[10] RHODIN TN, 1954, ANN NY ACAD SCI, V58, P855

[1] APPLICATIONS OF CURVED-CRYSTAL X-RAY SPECTROMETERS - MICROANALYSIS AND SIMULTANEOUS ANALYSIS [J]. ANALYTICAL CHEMISTRY, 1955, 27 (03) : 437 - 440

[2] BRISSEY RM, 1954, AM SOC TEST MATER, V157, P43

[3] CARL HF, 1954, AM SOC TEST MATER, V157, P63

[4] FRIEDMAN H, 1954, AM SOC TEST MATER, V157, P3

[5] METALLURGICAL APPLICATIONS OF X-RAY FLUORESCENT ANALYSIS [J]. JOURNAL OF APPLIED PHYSICS, 1952, 23 (04) : 427 - 433

[6] X-RAY ABSORPTION AND EMISSION [J]. ANALYTICAL CHEMISTRY, 1954, 26 (01) : 26 - 31

[7] MAHLA EM, 1948, J ELECTROCHEM SOC, V93, P339

[8] NOAKES GE, 1954, ASTM SPEC TECH PUBL, V157, P57

[9] TRACE ANALYSIS BY X-RAY EMISSION SPECTROGRAPHY [J]. NATURE, 1954, 174 (4426) : 397 - 397

[10] RHODIN TN, 1954, ANN NY ACAD SCI, V58, P855