AUTOMATIC RECORDING LASER INTERFEROMETER FOR LINE STANDARDS UP TO 2-M

被引：10

作者：

MATSUMOTO, H ^{[1
]}

SEINO, S ^{[1
]}

SAKURAI, Y ^{[1
]}

机构：

[1] CHIBA INST TECHNOL,NARASHINO,CHIBA 275,JAPAN

来源：

METROLOGIA | 1980年 / 16卷 / 04期

关键词：

D O I：

10.1088/0026-1394/16/4/003

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：169 / 175

页数：7

共 17 条

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[2]

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BRUCE, CF .

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[4]

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[5]

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[6]

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[7] A LINEAR SCALE COMPARATOR WITH A PHOTOELECTRIC MEASURING MICROSCOPE [J].

HOFFROGGE, C ;

RUMMERT, H .

METROLOGIA, 1968, 4 (02) :68-+

[8] ABSOLUTE WAVELENGTH MEASUREMENTS OF I-127 STABILIZED HE-NE-LASER OF NRLM [J].

ITO, N ;

TANAKA, K .

METROLOGIA, 1978, 14 (02) :47-51

[9]

Iwasaki S., 1980, Oyo Buturi, V49, P870

[10]

MASUI T, 1957, REV OPT, V36, P281

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