INTERFACE STRUCTURE IN HIGH-T(C) SUPERLATTICES

被引：3

作者：

GUIMPEL, J ^{[1
]}

FULLERTON, EE ^{[1
]}

NAKAMURA, O ^{[1
]}

SCHULLER, IK ^{[1
]}

机构：

[1] UNIV CALIF SAN DIEGO,DEPT PHYS 0319,LA JOLLA,CA 92093

来源：

JOURNAL OF PHYSICS-CONDENSED MATTER | 1993年 / 5卷

关键词：

D O I：

10.1088/0953-8984/5/33A/144

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

We have studied the structure of high-T(c) superlattices and films through refinement of the x-ray spectra. The results indicate that interdiffusion, layer thickness fluctuations and strains are present and cannot be neglected.

引用

页码：A383 / A384

页数：2

共 8 条

[1] CHAN IY, IN PRESS
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[3] STRUCTURAL REFINEMENT OF SUPERLATTICES FROM X-RAY-DIFFRACTION
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[5] SUPERCONDUCTIVITY IN NONSYMMETRIC EPITAXIAL YBA2CU3O7-X/PRBA2CU3O7-X SUPERLATTICES - THE SUPERCONDUCTING BEHAVIOR OF CU-O BILAYERS
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[6] HIGH-TC THIN-FILMS WITH ROUGHNESS SMALLER THAN ONE UNIT-CELL
NAKAMURA, O
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GUIMPEL, J
SCHULLER, IK
[J]. APPLIED PHYSICS LETTERS, 1992, 60 (01) : 120 - 122
[7] SUPERCONDUCTIVITY OF ONE-UNIT-CELL THICK YBA2CU3O7 THIN-FILM
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