PREDICTION AND MEASUREMENT OF RADIATION-DAMAGE TO CMOS DEVICES ON BOARD SPACECRAFT

被引:10
作者
CLIFF, RA
DANCHENKO, V
STASSINOPOULOS, EG
SING, M
BRUCKER, GJ
OHANIAN, RS
机构
[1] NASA,GODDARD SPACE FLIGHT CTR,GREENBELT,MD 20771
[2] RCA,DIV ASTROELECTR,PRINCETON,NJ 08540
关键词
D O I
10.1109/TNS.1976.4328578
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:1781 / 1788
页数:8
相关论文
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