X-RAY PHOTOELECTRON-SPECTROSCOPY ANALYSIS OF BI2SR2CA1-XYXCU2OY

被引:35
作者
SHICHI, Y
INOUE, Y
MUNAKATA, F
YAMANAKA, M
机构
[1] Central Engineering Laboratories, Nissan Motor Company, Limited, Yokosuka, Kanagawa 237, 1, Natsushima-cho
来源
PHYSICAL REVIEW B | 1990年 / 42卷 / 01期
关键词
D O I
10.1103/PhysRevB.42.939
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Experiments on x-ray photoelectron spectroscopy of Bi2Sr2Ca1-xYxCu2Oy were performed to investigate the change of valence of each atom and the distribution of Y atoms on the cation sites. The core-level binding energies of Sr and Y increased with increasing Y content and that of Bi did not change. The average valence of Cu was above 2 for 0.0 x 0.5 and below 2 for 0.8 x 1.0. Y atoms were substituted for the cations between the adjacent Cu-O planes. © 1990 The American Physical Society.
引用
收藏
页码:939 / 942
页数:4
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